基于单片机测量空气折射率  

Measurement of Air Refractive Index Based on Single-chip Microcomputer

作　　者：孙琳琳[1] 张立[1] 

机构地区：[1]北京林业大学理学院,北京100083

出　　处：《现代电子技术》2010年第22期166-167,171,共3页Modern Electronics Technique

基　　金：中央高校基本科研业务费专项资金资助(YX2010-12)

摘　　要：空气折射率的测定在众多应用领域有着重要的作用,为了能够准确、快速地测量出空气折射率,提出在Edlen经验公式的基础上,利用抗干扰能力较强的单片机系统,结合测量精度较高的温湿度传感器,构成基于单片机系统以空气中的温度、相对湿度、大气压力为参数的测定空气折射率的新的试验方法。在硬件器件测量精度较高的前提下,结合软件程序的控制与补偿,在Edlen经验公式的理论上实现测量精度达±5×10-8及便捷、快速的测量空气折射率的目的。The measurement of air refractive index plays an important role in many fields. In order to accurately and quickly measure the air refractive index, a new method of calculating the air refractive index is parametrized by air temperature, humidity and atmospheric pressure based on SCM system,constructed, which uses SCM system with strong anti-inter- ference ability and temperature and humidity sensors with high measurement accuracy based on the Edlen empirical formula. In the condition of high precision of hardware device measurement, the measurement accuracy is ±5×10^-8 based on the theo- ry of Edlen empirical formula through combining the control and compensation of software program, the convenient and fast measurement of air refractive index are fulfilled.

关 键 词：空气折射率 传感器 温度 相对湿度 气压 Edlen公式 

分 类 号：TN919-34[电子电信—通信与信息系统] TP212.9[电子电信—信息与通信工程]