用衍射光栅法测试Ⅰ型裂纹尖端区域应力场  

MEASUREMENT OF STRESS FIELDS AT THE TIP OF TYPE Ⅰ CRACK USING DIFFRACTION GRATING METHOD

作　　者：邢凯[1] 曹昌年[1] 杨东升[1] 高宏文 杨永正[1] 

机构地区：[1]西北工业大学应用物理系

出　　处：《光子学报》1999年第3期247-249,共3页Acta Photonica Sinica

基　　金：国家自然科学基金

摘　　要：本文以正交光栅作为应变传感器，采用衍射光栅法对不同载荷下Ⅰ型裂纹尖端区域应力场进行了测试。Crossed grating was selected as strain sensor in this paper,and stress fields at the tip of type Ⅰ crack under different loads were measured using diffraction grating method.The results were found to be in good agreement with current theories.

关 键 词：正交光栅 衍射光栅法 Ⅰ型裂纹 裂纹端应力场 

分 类 号：O346.1[理学—固体力学]