X射线分层成像的深度谱立体匹配技术  

Depth Spectral Stereo Matching for X Ray Stratified Imaging

作　　者：邹小庆[1] 王经瑾[1] 

机构地区：[1]清华大学工程物理系

出　　处：《核电子学与探测技术》1999年第3期178-181,共4页Nuclear Electronics & Detection Technology

摘　　要：Ｘ射线透视成像中物体互相重叠，有时边缘模糊不清。利用深度谱分析物体层次，提高了立体匹配的置信度，提高了Ｘ射线立体透视的分层成像的质量。给出了实测深度谱和分层成像结果。In fluoroscopy images, the edges of the objects are overlapped and sometimes blurred. A depth spectral method we developed for stereo matching has increased its credibility and realized the X ray stratified imaging. The measured depth spectrum and stratified images are presented.

关 键 词：立体匹配 X射线透视成像 分层成像 深度谱 

分 类 号：TL817.1[核科学技术—核技术及应用]