Tl-2212膜本征结阵列微桥微波特性测试与分析  

MICROWAVE PROPERTIES OF THE INTRINSIC JOSEPHSON JUNCTION ARRAY OF Tl 2212 FILM

作　　者：刘珩[1] 刘景芬[2] 

机构地区：[1]南开大学电子科学系 [2]天津大学数学系

出　　处：《低温物理学报》1999年第3期230-234,共5页Low Temperature Physical Letters

摘　　要：本文对Ｔｌ２２１２高温超导薄膜本征结阵列微桥这种新型超导结器件结构的微波特性进行了测试和分析．本征结串联阵列在外加微波的作用下发生锁相振荡，其ＩＶ特性呈现出明显且稳定的微波感应台阶，表明阵列微桥具有良好的微波响应．Abstract In this article we report for the first time a deep investigation on the Intrinsic Josephson Junction Array realized in the form of micro bridge with the epitaxial TlBaCaCuO HTS film, especially on the study of its microwave properties. The static and explicit Shapirro Step series are observed repeatedly. The test results and the corresponding analysis of them are presented. It is expected to obtain more meaningful results through further study.

关 键 词：高TC 超导薄膜 微桥微波特性 Tl-2212 本征结阵 

分 类 号：O511.1[理学—低温物理]