量子点探针测定痕量金属离子  

Application of quantum dots as fluoresent probes to detection of trace ions

作　　者：李建华[1] 张勇[1] 李英[1] 

机构地区：[1]成都理工大学材料与化学化工学院,四川成都610059

出　　处：《化学工程师》2010年第11期46-49,共4页Chemical Engineer

摘　　要：量子点是近几年发展起来的新型纳米材料。因其独特而优良的荧光特性,量子点成为了一种具有很大发展潜力的荧光探针。将量子点作为标记物的荧光分析法也成为国内外研究学者的研究热点。这种新型荧光分析法已经广泛地应用于生物科学、医学、分析化学等领域,并显示出极大的优越性。本文集中叙述了修饰剂对量子点的荧光性质的影响和量子点在分析检测痕量金属离子方面的应用,讨论了金属离子与量子点作用后荧光猝灭或荧光增强的可能的机理。Quantum dots is a new kind of specific nanoparticles which is developed in recent years.Due to the unique and excellent optical properties,quantum dots are a potential fluorescent probe.The fluorometry with quantum dots as the label has drawn great attention among investigators both here and abroad.The new determining method has been widely used in the area of biological,medical,analytical chemistry.In these areas,the new method has shown the great superiority.In this article we will make a summary review on the influence of modifier to the optical properties and the applications of quantum dots in the detection of trace ions.Also we will investigate the possible principle.The principle involves in the disappearance or the addition of fluorescence which is the effect of the reaction of trace ions and quantum dots.

关 键 词：量子点 痕量分析 荧光探针 金属离子 

分 类 号：O657.3[理学—分析化学]