应用于红外成像系统实验室的避漏电保护LISN设计  

Two New Designs of LISN Leakage Protection Applied in IR Imaging System Laboratory

作　　者：郑新波[1] 潘鸣[1] 裴云天[1] 

机构地区：[1]中国科学院上海技术物理研究所,上海200083

出　　处：《红外技术》2010年第11期649-653,658,共6页Infrared Technology

基　　金：国家预研项目

摘　　要：传导发射测试是红外成像系统必须通过的一项电磁兼容性测试。在研制阶段进行实验室内部的诊断性传导测试,将使得红外成像系统更容易满足电磁兼容标准要求,从而缩短了研发周期,提高了系统探测率。而漏电保护是红外成像系统实验室做传导测试所面临的首要问题。分析了红外成像系统实验室中传导测试使用LISN引起漏电保护的原因,并针对红外成像系统的特点提出了两种新的LISN设计方案,并在仿真中验证了设计的合理性,解决了红外成像系统实验室中做诊断性的传导测量引起的漏电保护问题。Electromagnetic compatibility test on conducted emissions is necessary for IR imaging system. In design stage of IR imaging system, doing laboratorial diagnostic conducted emissions test can make the lab design satisfy the requirement of EMC standards, thus can shorten the period of design and improve the system detectivity. The most important issue of the conducted emissions test is the leakage protection. The reason of leakage protection in conducted emissions test is discussed in this paper firstly. And then two new designs are proposed to avoid leakage protection. At last the better design is verified with computer simulation.

关 键 词：红外成像系统 LISN 传导发射 电磁兼容 漏电保护 

分 类 号：TN216[电子电信—物理电子学]