降氡活性炭微结构的X射线衍射研究  

Structural Studies of Some Activated Carbons with Different Radon Adsorption Ability by X-ray Diffraction Techniques

作　　者：王庆波[1] 朱文凯[2] 曲静原[1] 程金星[2] 周百昌[2] 

机构地区：[1]清华大学核能与新能源技术研究院,北京100084 [2]第二炮兵装备研究院第六研究所,北京100085

出　　处：《核电子学与探测技术》2010年第10期1279-1282,共4页Nuclear Electronics & Detection Technology

摘　　要：测定了四种活性炭对氡的动态吸附系数,其值有较大差距,对这四种活性炭进行了X射线衍射分析。对测得的X射线衍射强度谱,经过空气散射、自吸收和偏振校正后,利用Scherrer和Hirsch方法计算其微晶结构参数。结果表明,不同降氡性能的活性炭其微晶参数有较大差距,实验表明微晶尺度Lc为1.7 nm,La为1.9 nm,层叠数量为4的活性炭对氡有较强的吸附性能。Four different activated carbons with different radon adsorption ability were analyzed by X-ray diffraction techniques.Microcrystal parameters were calculated by Scherrrer and Hirsch equations.The results show that the activated carbon with microcrystal parameters at =1.7 nm,=1.9 nm,average layers =4 has the stronger adsorption ability in the for carbon samples,which can be referred when developing activated carbons for radon adsorption.

关 键 词：氡 活性炭 微晶 XRD 

分 类 号：TL75[核科学技术—辐射防护及环境保护]