动态线偏振光散射纳米颗粒粒度测量法的研究与分析  

Research and analysis of measurement method for nanoparticle size based on polarized light dynamic line scattering

作　　者：陈璐玲[1] 杨晖[1] 郑刚[1] 吴明华[1] 李孟超[1] 

机构地区：[1]上海理工大学光电信息与计算机工程学院,上海200093

出　　处：《光学仪器》2010年第5期1-5,共5页Optical Instruments

基　　金：上海市优青项目;上海市科委纳米专项基金资助项目(0852nm06700)

摘　　要：多重散射是传统动态光散射法测量纳米颗粒溶液浓度上限受到限制的主要原因。为此文中提出了动态线偏振光散射纳米颗粒粒度测量法,通过改变颗粒入射光和散射光的偏振状态,降低颗粒间多重散射的影响。现利用Mie散射理论分析了入射光与散射光偏振状态之间的关系,并通过实验方法探知偏振光在散射介质中的传输特性,揭示了在动态光散射中使用垂直偏振光作为入射光的实验依据。最后对动态线偏振光散射颗粒测量法和传统光子相关光谱测量法进行了实验及分析,通过两种方法的比较,验证了上述理论的正确性。Multiple scattering is the main reason limiting measurement of nanoparticle concentration in the traditional dynamic light scattering. For this, we proposed the methods, ascertaining the transmission characteristics of polarized light in scattering media, revealed the experimental evidence of the use of a vertically polarized incident light in dynamic light scattering. Finally experimental analysis of the measurement system for polarized light based on dynamic line scattering and conventional photon correlation spectroscopy. Through the comparison of two methods to verify the correctness of the above-mentioned theory.

关 键 词：动态光散射 纳米颗粒 偏振 MIE散射 

分 类 号：TN24[电子电信—物理电子学]