某型高度表的可靠性增长分析  

Reliability Growth Analysis of a Type of Altimeter

作　　者：周源泉[1,2] 郭建英[1,2] 

机构地区：[1]北京强度环境研究所 [2]哈尔滨理工大学

出　　处：《导弹与航天运载技术》1999年第3期23-31,共9页Missiles and Space Vehicles

基　　金：国家自然科学基金

摘　　要：对某型高度表的综合环境下的可靠性增长试验的故障信息，用多台不同步截尾的ＡＭＳＡＡ模型及多台同步ＡＭＳＡＡ－ＢＩＳＥ模型进行了详细的统计分析，结果表明，产品有显著的可靠性增长，故障数据可用ＡＭＳＡＡ模型跟踪，其平均故障间隔时间（ＭＴＢＦ）的置信下限超过了总体部门下达的指标。Using multi system nonsynchronous truncated AMSAA model and multi system synchronous truncated AMSAA BISE model, the failure data of reliability growth testing in combined environment for a type of altimeter are analysed in detail. The results indicate that the product has significant reliability growth, the failure data can be tracked by AMSAA model, and the lower confidence limits of MTBF for the altimeter exceed the desired value given by the overall department.

关 键 词：高度表 可靠性增长试验 可靠性分析 航天仪表 

分 类 号：V441[航空宇航科学与技术—飞行器设计]