Structural stability of C_(60) films under the bombardment of 1.95 GeV Kr ions  

作　　者：YAO CunFeng FU YunChong JIN YunFan WANG ZhiGuang ZANG Hang WEI KongFang GOU Jie MA YiZhun SHEN TieLong 

机构地区：[1]Institute of Modern Physics, Chinese Academy of Sciences, Lanzhou 730000, China [2]Graduate University of Chinese Academy of Sciences, Beijing 100049, China [3]Institute of Earth Environment, Chinese Academy of Sciences, Xi'an 710075, China

出　　处：《Chinese Science Bulletin》2010年第31期3533-3537,共5页

基　　金：supported by the National Natural Science Foundation of China (10835010,10675150,10175084);the National Basic Research Program of China (2010CB832902)

摘　　要：The structural stability of C60 films under the bombardment of 1.95 GeV Kr ions is investigated.The irradiated C60 films were analyzed by Fourier Transform Infrared(FTIR) spectroscopy and Raman scattering technique.The analytical results indicate that the irradiation induced a decrease of icosahedral symmetry of C60 molecule and damage of C60 films;different vibration modes of C60 molecule have different irradiation sensitivities;the mean efficient damage radius obtained from experimental data is about 1.47 nm,which is in good agreement with thermal spike model prediction.The structural stability of C60 films under the bombardment of 1.95 GeV Kr ions is investigated. The irradiated C60 films were analyzed by Fourier Transform Infrared （FTIR） spectroscopy and Raman scattering technique. The analytical results indicate that the irradiation induced a decrease of icosahedral symmetry of C60 molecule and damage of C60 films; different vibration modes of C60 molecule have different irradiation sensitivities; the mean efficient damage radius obtained from experimental data is about 1.47 nm, which is in good agreement with thermal spike model prediction.

关 键 词：C60薄膜 离子轰击 结构稳定性 傅立叶变换红外光谱 C60分子 伏特 电子 氪 

分 类 号：O484[理学—固体物理] O484.1[理学—物理]