基于V-I曲线的电路板故障测试卡的实现  

Implementation of fault-testing card for circuit board based on V-I curve

作　　者：王东平 俞峰 戚茂会 

机构地区：[1]安徽锐捷特种电子设备厂,合肥230000

出　　处：《电子测试》2010年第11期87-91,共5页Electronic Test

摘　　要：设计了一种基于V-I曲线的电路板故障测试卡。它采用PCI接口的形式,在上位机的控制下产生测试所需的电压扫描信号,同时逐点采集其电流值,并实时将电压与对应的电流值经PCI接口送上位机做故障分析。该测试卡架构灵活,采用PCI卡+专用测试诊断软件的模式,可用于各种类型电路板的故障测试,同时可扩展到分机及任意电气特性节点,特别适合现场及野外维修等场合。本文详细介绍了测试卡的硬件设计,包括原理图及关键程序段,最后设计了一个简单的测试DEMO,验证了预期的结果。We designed a circuit board fault-testing card based on the V-I curve.It uses the form of PCI interface , Under the control of the PC to generate the voltage scan signal which required for the testing, while collection its current value point by point, And sent the voltage and its corresponding current real time to the pc do failure analysis through the PCI interface. The architecture of this card is flexible, using the testing model for PCI CARDS ＋ special diagnostic software, it can be used for fault testing in various types of circuit board, and also can extended to the machine and any electrical properties node, especially suitable for on-site and wild maintenance. This paper introduces the hardware design for this card in detailed, including the schematic and key program, finally designed a simply testing DEMO, testify the expected result.

关 键 词：电路板 故障诊断 V-I曲线 PCI接口 

分 类 号：TN407[电子电信—微电子学与固体电子学]