X射线衍射全谱拟合法测定碳/碳复合材料的点阵常数  

Determination of Lattice Constants for C/C Composites by Using X-ray Diffraction Technique and Rietveld Refinement Method

作　　者：王晓叶[1] 李同起[1] 郑斌[1] 冯志海[1] 李仲平[1] 

机构地区：[1]航天材料及工艺研究所先进功能复合材料技术国防科技重点实验室,北京100076

出　　处：《宇航材料工艺》2010年第2期94-96,共3页Aerospace Materials & Technology

摘　　要：利用X射线衍射仪,采用全谱拟合的方法,测定三种不同碳材料的点阵常数、石墨化度及微晶参数,测得三种碳材料(每个样品重复5次试验)六方晶系的a的标准偏差小于2.0×10-3,c的标准偏差小于1.4×10-3,石墨化度(g)的标准偏差小于1.5,微晶参数(Lc002)的标准偏差小于0.5,是一种有效的测试碳材料晶体参数的方法。Graphitization degree, lattice constant and crystallite sizes of three kinds of C/C composites were measured by rietveld refinement method （whole spectrum fitting） of X-ray diffraction. The results show that standard deviation of crystal the parameter of the three C/C composites is less than 2.0×10^-3, standard deviation of graphitization degree（g） is less than 1.5, standard deviation of crystallite sizes（Lc002） is less than 0.5. Rietveld refinement method of X-ray diffraction is effective for investigation of the crystal parameters of C/C composite.

关 键 词：X射线衍射仪 全谱拟合法 点阵常数 石墨化度 微晶参数 

分 类 号：TB332[一般工业技术—材料科学与工程]