超微量钐同位素的热表面电离质谱分析  

Analysis of Trace Samarium Isotopes by Thermal Ionization Mass Spectrometry

作　　者：汤磊[1] 刘雪梅[1] 刘钊[1] 杨天丽[1] 龙开明[1] 

机构地区：[1]中国工程物理研究院核物理与化学研究所,四川绵阳621900

出　　处：《岩矿测试》2010年第6期659-662,共4页Rock and Mineral Analysis

摘　　要：采用双带测量方式,法拉第杯和离子计数器同时接收与跳峰接收相结合,建立了超微量钐同位素的热表面电离质谱的测量方法。优化了制样程序和质谱测量程序,研究了蒸发带电流对离子流强度的影响,考察了从纳克至微克不同样品用量的测量效果及其中Nd、Eu干扰核素的情况。对4 ng^2μg的天然丰度钐样品进行了同位素比值分析,相对标准偏差均小于1.1%。The method for analysis of trace samarium isotopes by thermal ionization mass spectrometry（TIMS） was developed.The double-filament mode was used for the measurement and Faraday cup and ion counter was used as detectors working in both multi-collector static mode and multi-collector jumping mode.The procedures for both sample loading and TIMS measurements were optimized.The effect of filament current on ion beam intensity and the effect of sampling dosages from nanogram to microgram on the measurements were studied.The interference from the Nd and Eu isotopes on Sm isotope measurement was also examined.The method has been used in samarium isotope ratio measurements for natural samarium samples with concentration level of Sm from 4 ng to 2 μg.The measurement precision was better than 1.1%RSD.

关 键 词：钐 热表面电离质谱法 超微量 

分 类 号：O614.337[理学—无机化学] O628[理学—化学]