LB法制备的P(VDF-TrFE)共聚物薄膜其光学和电学特性研究(英文)  

OPTICAL AND ELECTRIC PROPERTIES OF POLY(VINYLIDENE FLUORIED-TRIFLUOROETHYLENE)THIN FILM BY LANGMUIR-BLODGETT TECHNIQUE

作　　者：王建禄[1] 孟祥建[1] 高艳卿[1] 黄志明[1] 沈宏[1] 孙璟兰[1] 褚君浩[1] 

机构地区：[1]中国科学院上海技术物理研究所红外物理国家重点实验室,上海200083

出　　处：《红外与毫米波学报》2010年第6期406-409,456,共5页Journal of Infrared and Millimeter Waves

基　　金：National Natural Science Foundation of China(60221502,60777044,60771057);Natural Science Foundation of Shanghai(07JC14018,07ZR14129)

摘　　要：运用郎缪尔-布尔吉特法在聚酰亚胺衬底上制备聚偏氟乙烯及三氟乙烯（P（VDF-TrFE））共聚物薄膜.不同厚度薄膜的X射线衍射结果表明,薄膜具有良好的结晶特性,取向为（110）.运用波长范围为300-1300nm的椭圆偏振光谱仪对薄膜光学特性进行了表征;运用Cauchy模型对不同角度（θ=75°和85°）测得的Ψ和Δ数据进行了拟合.获得了P（VDF-TrFE）薄膜的光学参数n,k,α以及薄膜的厚度.另外对薄膜的铁电性质的测量,其剩余极化达到了6.3μC/cm^2,矫顽电场为100MV/cm.介电测量得到了薄膜两个明显的相变,铁电-介电相变以及β弛豫.Poly（vinylidene fluoride-trifluoroethylene）（P（VDF-TrFE）） thin films were deposited on polyimide substrate using horizontal Langmuir-Blodgett（LB） technology.X-ray diffractions indicate that the films have good crystallinity with（110） preferential orientation for films with different thickness.The optical dispersion of the films were measured by variable-angle spectroscopic ellipsometry.The data Ψ and Δ at multiple incident angels（θ=75° and 85°） were fitted using the Cauchy model.The refractive index,extinction coefficient,absorption coefficient and thickness of each film were obtained.The ferroelectric of the films were studied.The remnant polarization is up to 6.3μC/cm^2.The coercive field is 100MV/cm.The dielectric measurement for the film shows two distinctive phase transitions,ferroelectric-paraelectric phase transition and β relaxation.

关 键 词：LB技术 P(VDF-TrFE)薄膜 椭圆偏振光谱 电学特性 

分 类 号：TQ320.77[化学工程—合成树脂塑料工业]