基于双线性回归法的真空荧光显示器寿命预测  

Lifespan Prediction of Vacuum Fluorescent Display Using Bilinear Regression Method

作　　者：陈发堂[1] 张建平[2] 

机构地区：[1]上海电力学院设备与实验室管理处,上海200090 [2]上海电力学院能源与环境工程学院,上海200090

出　　处：《上海大学学报（自然科学版）》2010年第6期625-629,共5页Journal of Shanghai University:Natural Science Edition

基　　金：新型显示技术及应用集成教育部重点实验室(上海大学)资助项目(P201006);上海市教委科研创新基金资助项目(11ZZ172);上海市教委重点学科建设资助项目(G51304);上海市自然科学基金资助项目(09ZR1413000)

摘　　要：为了在较短的时间内获得真空荧光显示器(vacuum fluorescent display,VFD)的寿命信息,节省试验时间,降低预测成本,通过对VFD失效机理进行分析,开展了4组恒定应力加速寿命试验,采用三参数威布尔函数描述其寿命分布,利用双线性回归法(bilinear regression method,BRM)实现了VFD的寿命预测.数值结果表明,VFD的寿命服从三参数威布尔分布,其加速模型符合线性阿伦尼斯方程,每个加速应力水平下VFD的失效机理保持不变.该试验方法和理论模型使得短时间内精确预测VFD寿命成为可能.In order to obtain the lifespan information of vacuum fluorescent display （VFD） within a short time to reduce the cost of lifespan prediction, four constant stress accelerated life tests （CSALT） were conducted, and the VFD failure mechanism analyzed. Lifespan prediction was done by modeling the lifespan with the three-parameter Weibull distribution. A bilinear regression method was used to estimate the Weibull parameters. Numerical results show that the test scheme of CSALT is appropriate, lifespan of VFD follows a three-parameter Weibull distribution, the life-stress relationship satisfies the linear Arrhenius equation, and the VFD failure mechanism is the same under different acceleration-stress levels. The proposed test method and the theoretical model allow rapid lifespan prediction of VFD.

关 键 词：真空荧光显示器 寿命预测 三参数威布尔分布 双线性回归法 

分 类 号：TN141[电子电信—物理电子学] TN102