导电粉体堆砌体积电阻率的测试方法研究  

Study on Characterization Method of Stacking Volume Resistance of Conductive Fillers

作　　者：李雪飞[1] 韩婷婷[1] 张岩[1] 胡洁[1] 郑元锁[1] 

机构地区：[1]西安交通大学理学院,陕西西安710049

出　　处：《贵金属》2010年第4期42-45,共4页Precious Metals

摘　　要：设计了一种金属粉体导电特性的表征方法,以银粉为测试样本,采用堆砌体积电阻率表征粉体的导电特性。分别考察了填充量、测试负荷、测试稳定时间等因素对银粉堆砌体积电阻率的影响。结果表明当银粉填充量为4 g、测试负荷为800 g和测试稳定时间为30 min时,所得实验结果可以准确反映银粉的堆砌体积电阻率。A new characterization method of conductive fillers has been introduced in this paper via measuring the stacking volume resistivity of silver powders.The effects of the filling amount of silver powders,measuring load and measuring settling time on the stacking volume resistivity of silver powders were investigated.The results indicate that when the filling amount of silver powders is 4 g,the measuring load is 800 g and the measuring settling time is 30 minutes,the measuring date obtained can accurately reflect the stacking conductive characteristics of metal powders.

关 键 词：金属材料 银粉 粉体 导电 体积电阻率 

分 类 号：TM241[一般工业技术—材料科学与工程]