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作 者:何刚[1] 赵恒北[1] 戎咏华[1] 郭正洪[1] 陈世朴[1] 徐祖耀[1]
机构地区:[1]上海交通大学材料科学与工程学院
出 处:《上海交通大学学报》1999年第7期765-768,773,共5页Journal of Shanghai Jiaotong University
基 金:国家自然科学基金;教育部博士学科点专项科研基金
摘 要:将X射线衍射峰位移法引入用于测量Fe-Mn-Si合金的层错几率α.所需要的精确点阵常数由数值计算获得,并评价了内应力引起的峰位移对测量结果的影响.内应力引起的α测量值相对误差约4%,因而可忽略不计.研究结果表明,随Mn含量的减少或训练次数的增加,α增加.值得指出的是,峰位移法可用来测量单一的形变α,而不像峰位移法给出两种层错几率之和(α+β),其中β是生长层错几率.鉴于所研究合金的形状记忆效应源于重叠的形变层错所生成的应力诱发马氏体,所以α的测量比(α+β)更为重要.The X ray diffraction peak shift method was firstly introduced into the determination of stacking fault probability ( α ) of Fe Mn Si alloys with various Mn contents and thermomechanical cycling numbers. The precise lattice constants required were solved by numerical calculation. The influence of internal stress on the result was evaluated, and the caused relative error in determined α is about 4% and thus is negligible. The results show that the stacking fault probability increases with decreasing Mn content or increasing cycle number. However, it is noteworthy that the peak shift method can be used to determine only the deformation fault probability α rather than the sum of ( α+β ) provided by the peak broadening method, where β is the growth fault probability. Considering that the shape memory effect of the investigated alloys is originated from the stress induced ε martensite formed by overlapped deformation faults, the determination of α is therefore more important than that of (α+β).
分 类 号:TG139.6[一般工业技术—材料科学与工程] TG145[金属学及工艺—合金]
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