用中子活化分析镀膜厚度及其探测极限研究  

Investigation on Feasibility and Detection Limits for Determination of Coating Film Thickness by Neutron Activation Analysis

作　　者：姚茂莹[1] 徐家云[1] 高党忠[2] 张地大[1] 杨尊勇[1] 姚振强[1] 王明秋[1] 

机构地区：[1]四川大学物理科学与技术学院,四川成都610064 [2]中国工程物理研究院激光聚变研究中心,四川绵阳621900

出　　处：《原子能科学技术》2010年第12期1509-1512,共4页Atomic Energy Science and Technology

基　　金：国家自然科学基金-中国工程物理研究院联合基金资助项目(10476017)

摘　　要：本工作提出用中子活化分析有基底的单层或多层镀膜厚度的方法。用Am-Be中子源对Au、Al、Cu等薄膜活化后,用HPGe探测器测量被活化薄膜放出的特征γ射线全能峰面积,并用蒙特卡罗方法模拟计算HPGe探测器对不同特征γ射线的探测效率,得到用反应堆中子源活化分析不同元素镀膜厚度的方法和探测极限。与目前广泛使用的X射线荧光方法相比,其分析灵敏度可提高几个量级。A method for the determination of coating film thickness by neutron activation was proposed in this paper.After Au,Al and Cu et al.films were activated with a Am-Be neutron source,the characteristic γ-rays emitted by the activated nuclides in the films were counted with a HPGe γ spectrometer.The detection limits of film thickness by using a nuclear reactor neutron source were deduced on the basis of the γ-ray counts and the Monte-Carlo simulated detection efficiencies.The possible detection limits are typically 4-5 orders of magnitude better than those by fluorescent X-ray method,which is currently widely used to determine coating film thickness.

关 键 词：镀膜厚度 中子活化 测量灵敏度 

分 类 号：TL364.5[核科学技术—核技术及应用]