化学溶液分解法制备(Bi_(0.8)Ce_(0.2))_2Ti_2O_7薄膜及性能研究  

Preparation and Characterization of (Bi_(0.8)Ce_(0.2))_2Ti_2O_7 Thin Films by Chemical Solution Decomposition Method

作　　者：荆象阳[1] 秦晓燕[2] 张晓阳[2] 张寅[3] 

机构地区：[1]山东电力研究院,济南250002 [2]山东大学晶体材料国家重点实验室,济南250100 [3]齐鲁师范学院物理科学与技术系,济南250013

出　　处：《人工晶体学报》2010年第6期1372-1375,1380,共5页Journal of Synthetic Crystals

基　　金：国家自然科学基金(50721002;10774091)资助项目;国家重点基础研究发展计划(973)(2007CB613302)资助项目

摘　　要：采用化学溶液分解法(CSD)在p型Si<100>衬底上制备了(Bi0.8Ce0.2)2Ti2O7薄膜,采用X射线衍射技术研究了薄膜的结构和结晶性。研究表明:Ce3+部分取代Bi3+能够显著提高Bi2Ti2O7薄膜的相稳定性。同时还研究了薄膜的电容-电压特性、介电常数、介电损耗。结果表明,该薄膜具有良好的介电特性。（Bi0.8Ce0.2）2Ti2O7 thin films were grown on p-Si100 substrates by chemical solution decomposition method.The structure and crystallization characteristics of the films were studied by X-ray diffraction（XRD）.It is indicated that if Bi ions are partly substituted by Ce ions,the phase stability of Bi2Ti2O7 would be improved evidently.Capacitance-voltage properties,dielectric constants and dielectric loss of the thin films were studied.The results show that the prepared（Bi0.8Ce0.2）2Ti2O7 thin films have good dielectric properties.

关 键 词：化学溶液分解法 (Bi0.8Ce0.2)2Ti2O7薄膜 相稳定性 

分 类 号：TB43[一般工业技术]