基于BIT技术的运载火箭测试系统研究  

Research on Carrier Rocket Testing System Based on BIT Technology

作　　者：梁晓朋[1] 蔡远文[1] 伯伟[1] 

机构地区：[1]装备指挥技术学院,北京101416

出　　处：《航天控制》2010年第6期81-84,92,共5页Aerospace Control

基　　金：总装试验技术研究项目(2009SY4106002)

摘　　要：BIT(Built-In Test)技术是一种能够显著改善系统或设备测试性能和诊断能力的重要技术手段。本文主要介绍了BIT技术的性能、特点、结构,分析了BIT技术在运载火箭测试中应用的意义和可行性,并详细提出了基于BIT技术的运载火箭测试方案以及方案中的关键技术和主要解决途径。研究结果表明此方案有效可行,并对其在航天测试中的应用给予了展望。The BIT technology is an important technology,which can remarkably improve test function and fault detection of the system or equipment.The technical capability,characteristics and structure of BIT are introduced and the meaning and possibility of BIT technology applied in the carrier rocket testing realm is analyzed.The test project based on BIT system,key techniques and solutions are proposed in detail.The result of this research shows that the scheme is feasible and effective,and the development of spaceflight test in the future is described.

关 键 词：机内测试(BIT) 运载火箭 测试系统 

分 类 号：V553.21[航空宇航科学与技术—人机与环境工程]