航天电连接器综合应力可靠性统计模型的验证  

Reliability Statistical Model Verification of Aerospace Electrical Connectors under Multiple Stresses

作　　者：钱萍[1,2] 陈文华[2] 高亮[1] 卢献彪[3] 马子魁 

机构地区：[1]浙江大学流体传动与控制国家重点实验室,杭州310027 [2]浙江理工大学,杭州310018 [3]中国航天科技集团公司九院八二五厂,杭州310015

出　　处：《中国机械工程》2011年第3期257-261,273,共6页China Mechanical Engineering

基　　金：国家自然科学基金资助项目(50745040;50935002);国家高技术研究发展计划(863计划)资助项目(2007AA04Z409);民用航天科技预研资助项目(B1220062302);浙江省自然科学基金资助项目(Y1100777);浙江理工大学科研启动基金资助项目(1003809-Y)

摘　　要：针对目前普遍存在的可靠性统计模型准确性的问题,依据从失效机理推导出的电连接器综合应力作用下的广义Eyring-Weibull模型,从统计检验角度出发,利用恒定综合应力加速寿命试验数据,应用概率纸检验法及范-蒙特福特检验法,验证了电连接器的寿命服从威布尔分布;利用图分析和回归分析,验证了航天电连接器的加速寿命方程为广义Eyring模型。验证结果表明,广义Eyring-Weibull模型能较好地描述Y11P系列电连接器寿命特征在综合应力作用下的变化规律。For problems of reliability statistical model＇s accuracy,aiming at verifying the generalized Eyring-Weibull model of electrical connectors under multiple stresses derived from failure mechanism,from the statistical test point of view,based on the constant accelerated life test under multiple stresses,by using the probability graph and Van-Montfort methods,the failure life distribution of electrical connectors was verified that it followed Weibull distribution;by regression analysis,the accelerated life equation of electrical connectors was validated to be generalized Eyring model.The results provide a powerful evidence for that the reliability statistical model of Y11P series electrical connectors derived from failure mechanism can preferably describe its life characteristics.

关 键 词：电连接器 综合应力 可靠性统计模型 回归分析 

分 类 号：TB114.3[理学—概率论与数理统计] V442[理学—数学]