金属化膜脉冲电容器的可靠性评估  

Reliability assessment of metallized film pulse capacitor

作　　者：贾占强[1] 蔡金燕[1] 梁玉英[1] 韩春辉[1] 

机构地区：[1]解放军军械工程学院光学与电子工程系,石家庄050003

出　　处：《强激光与粒子束》2011年第1期272-276,共5页High Power Laser and Particle Beams

基　　金：国家自然科学基金项目(60472009)

摘　　要：为更加高效地评价自愈式高储能密度金属化膜脉冲电容器的可靠性水平,提出了一种基于步降加速退化试验的金属化膜脉冲电容器可靠性评估算法。对步降加速退化试验进行了阐述,深入探讨了可靠性评估中的关键步骤——试验数据折算过程。在此基础上,提出了基于伪失效寿命的步降加速退化可靠性评估算法和基于随机退化轨迹的步降加速退化可靠性评估算法,最后利用具体实例对该方法的有效性进行了验证。结果表明,与现有方法相比,该方法在保证评估精度的基础上,试验时间可以缩短45%。A new reliability estimation algorithm for metallized film pulse capacitor was brought forward based on step-down stress accelerated degradation testing（SDSADT） method.The SDSADT was expounded,and the key procedure in the reliability estimation,i.e.testing data conversion,was fully explained.Then reliability assessment arithmetics based on pseudo failure lifetime and random degradation path were proposed.A numerical example was given to illustrate the algorithm.The results show that,at the same estimation precision,this algorithm can have a testing time 45% shorter than that based on constant stress accelerated degradation method.

关 键 词：可靠性 加速退化试验 金属化膜脉冲电容器 伪失效寿命 随机退化轨迹 

分 类 号：TB114.3[理学—概率论与数理统计]