阵列化互连LED模组寿命分布的蒙特卡洛模拟  

Monte-Carlo simulation of lifetime distribution on array interconnection of LED module

作　　者：郑同场[1,2] 李炳乾[3] 夏正浩[2] 

机构地区：[1]厦门大学物理系半导体光子学研究中心,福建厦门361005 [2]华南师范大学光电子材料与技术研究所,广东广州510631 [3]佛山科技学院物理系,广东佛山528000

出　　处：《光电子．激光》2011年第2期207-210,共4页Journal of Optoelectronics·Laser

基　　金：广东省自然科学基金资助项目(04011642);佛山市科技发展专项基金资助项目(04030021)

摘　　要：利用蒙特卡洛方法对阵列化互连LED模组的可靠寿命进行了模拟,假设分档后的大功率白光LED的正向电压符合正态分布,额定电流下的寿命符合对数正态分布,且寿命和电流、温度的关系符合Eying模型,研究了n×n(6≤n≤12)LED阵列的寿命分布。模拟结果表明,对于n×nLED阵列,寿命随LED数目的增加没有下降反而略有增加,表明对多数目LED模组采用阵列化互连电路较传统串并联电路具有优势,能提高阵列的可靠性;对系统采用电流降额使用,可靠寿命随着电流降额量的增大而增大,电流降额越大,寿命增大越多;多数目LED大阵列结合较高的电流降额量能大幅度提高系统的可靠性。Based on Monte-Carlo simulation,the lifetime distribution on array interconnection of high-power LED module is studied.It′s assumed that the forward voltage of power white LEDs follows normal distribution after bins,the mean lifetime at 350 mA follows Lognormal distribution,and the relationships between work current,temperature and lifetime are consistent with Eying model.For n×n LED array,the reliability lifetime does not decrease but increases slightly while the total number of LEDs increases.The results indicate that the array interconnect circuit has obvious advantage over the conventional series-parallel connection circuit,which can improve the reliability of LED array significantly.For different current derating values,the lifetime increases monotonically as the derating increases,and the larger the derating,the more increase of the lifetime.Especially,applying large derating to the array with a large number of LEDs can improve the reliability of LED array greatly.

关 键 词：LED模组 蒙特卡洛模拟 阵列化互连 可靠寿命 电流降额 

分 类 号：TN312.8[电子电信—物理电子学]