空间滤波器截止频率对三维形貌测量精度的影响  

Influence of cut-off frequency of spatial filter on the accuracy of 3-D profile measurement

作　　者：宁韩利[1] 孙杰[1] 许中奇[1] 杨明[1] 田静[2] 

机构地区：[1]天津理工大学电子信息工程学院,天津300191 [2]天津理工大学计算机学院,天津300191

出　　处：《光电子．激光》2011年第2期272-276,共5页Journal of Optoelectronics·Laser

基　　金：天津市科委自然科学基金资助项目(06YFJMC15600)

摘　　要：分析了在三维形貌测量中,对结构光调制图像进行低通滤波时,截止频率的选取对三维形貌测量精度的影响,并给出了三维形貌测量精度的处理过程和结果。对带有结构光调制的图像进行不同截止频率的空间滤波处理和比较。实验结果表明,该方法可以提高三维形貌测量的精度。In 3-D profile measurement,when the modulated image by the structure light was processed by low-pass filter,the influence of cut-off frequency on the accuracy of 3-D profile measurement was analyzed in this paper,and the treatment process and results of 3-D profile measurement were presented.The modulated image by the structure light was processed by spatial filtering with different cut-off frequencies and the results were compared.Experimental results show that this method can enhance the accuracy of 3-D profile measurement.

关 键 词：Butterworth低通滤波器 截止频率 三步相移法 三维形貌测量 

分 类 号：TN29[电子电信—物理电子学]