TFT-LCD取向层表面的针孔缺陷分析(英文)  

Analysis of Pinhol Defects on Alignment Layer Surface for TFT-LCD

作　　者：黄东升[1] 赵凯[1] 夏子祺 王威[1] 张志男[1] 

机构地区：[1]北京京东方光电科技有限公司,北京100176

出　　处：《液晶与显示》2011年第1期23-27,共5页Chinese Journal of Liquid Crystals and Displays

摘　　要：在TFT-LCD的生产过程中,取向层表面针孔缺陷是造成产品不良的常见原因。应用聚焦离子束(FIB)、扫描电子显微镜(SEM)和光学测量系统(OMS)工具,并结合数据统计软件Business Objects(BO)对实际生产过程中的一种典型产品不良——黑点,进行了测试和分析。结果表明,取向层表面针孔缺陷是产生黑点不良的根本原因。在此基础上,进一步通过理论分析和实验研究证明,成膜过程中膜液的流体力学不稳定性是导致取向层表面针孔缺陷的重要原因,而固化时间则是影响流体力学不稳定性的重要参数。膜液流体力学不稳定性的充分发展并最终对膜结构产生影响需要一定时间,当固化时间接近甚至小于不稳定性充分发展的时间时,取向层表面产生针孔缺陷的机会将大大减小甚至消除。The pinholes on the surface of alignment layer was studied,which formed during the TFT-LCD manufacturing process and caused defects of the products.Herein,a vitally typical defect,black spot,was analyzed via FIB,SEM and OMS.The analysis results of sta-tistical software BO（Business Objects）show that the pinhole is the main cause of the blackspot.Based on theoretical analysis and further experimental results,it is found that the hy-drodynamic in stability of the solution may lead to the pinholes on the alignment layer surface,and the precure time of the alignment film solution is significantly responsible for hydrodynamic instability.It is noteworthy that the instability needs times to grow full enoughand then to influence the film structure.Therefore,the pinholes on the alignment layer surface will be reduced or eliminated if the precure time is less than or equal to that time.

关 键 词：TFT-LCD 取向 针孔 预烘 缺陷分析 流体力学不稳定性 

分 类 号：TN141.9[电子电信—物理电子学]