OLED光电性能综合测试系统的设计  

Design of Integrated Testing System for OLED Photoelectric Properties

作　　者：张玉杰[1] 宋孟华[1] 

机构地区：[1]陕西科技大学电气与信息工程学院,陕西西安710021

出　　处：《液晶与显示》2011年第1期64-67,共4页Chinese Journal of Liquid Crystals and Displays

基　　金：陕西省教育厅专项基金(No.09JK371)

摘　　要：针对目前有机发光二极管(OLED)器件光电性能测量普遍采用分立设备手动测量的现状,提出了一种以微控制器为核心的OLED光电性能综合测试系统方案,介绍了系统各部分的软硬件设计方法。系统可以在一个平台上同时对发光器件的各种光电特性进行测量,实现了光电特性实验的计算机化,具有综合性强、测量方便、精确度高等特点。In order to improve the current manual testing situation based on discrete devices,a comprehensive photoelectric property testing system with a core of microcontroller is introduced in this paper,and the software and hardware design of this system are discussed in detail.The photoelectric properties of luminescent devices can be measured simultaneously by using a single platform which makes the experiment computerized,and has advantages of high integrity,convenient and accuracy.

关 键 词：OLED 光电性能 测试系统 

分 类 号：TN383.1[电子电信—物理电子学]