一种新的半导体激光器线宽展宽因数测量算法  

New measurement method for linewidth enhancement factor based on self-mixing interferometry

作　　者：叶会英[1] 王艳花[1] 禹延光[1] 

机构地区：[1]郑州大学信息工程学院,河南郑州450052

出　　处：《激光与红外》2011年第2期155-159,共5页Laser & Infrared

基　　金：国家自然科学基金项目(No.60871031)资助

摘　　要：在外腔波动情况下,根据光反馈自混合干涉系统不同反馈机制下的干涉信号特征,设计了由一个周期内信号特征点在靠近振动中心位置的下条纹中相对应的映射点位置测量线宽展宽因数的算法。通过仿真和实验验证:与以往算法相比,本文设计的算法不受光反馈水平机制的限制。线宽展宽因数的精确测量对于半导体激光器性能的研究与应用具有重要意义。In the situation of the external cavity fluctuation, the algorithm of measuring Linewidth Enhancement Factor （LEF） is designed. It is based on the down-fringle mapping point position near the center of vibration signal. Com- pared with previous algorithm, the algorithm presented in this paper is free of the limitation of the optical feedback mechanism level ,which is proven by both simulation and experiments. The accurate measurement of LEF is of great significance to semiconductor lasers performance research and application.

关 键 词：光反馈自混合干涉 线宽展宽因数 映射点位置测量 反馈机制 

分 类 号：TN248.4[电子电信—物理电子学]