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机构地区:[1]江南大学化学与材料工程学院,江苏无锡214122 [2]南京理工大学化工学院,江苏南京210094
出 处:《应用化工》2011年第1期170-172,共3页Applied Chemical Industry
摘 要:用粉末压片X射线荧光光谱法测定BaTiO3中Ba、Ti、Mg、Si、Fe、Sr含量。根据钛酸钡样品中主次成分含量范围,采用在高纯钛酸钡样品(纯度≥99.99%)中加入梯度量各杂质元素标准溶液的方法制作校准样品系列,解决了无钛酸钡标准样品的问题。采用经验影响系数法纠正基体效应,并对较准样品的配制方法、压片机压力、粒度效应等进行了探讨。方法用于钛酸钡中主次元素含量测定时,测定结果与化学分析法相符,相对标准偏差均小于6.73%。A method for the determination of Ba,Ti,Mg,Si,Fe,Sr in arium titanate by X-ray fluorescence spectrometry was introduced.The sample powder was directly pressed into discs and used in the analysis.Based on the content range of major and minor chemical components in arium titanate,the calibration sample series were prepared by adding a range of different volumes of standard solution of impurity elements to high purity arium titanate,which was a solution to the lack of standard samples.Matrix effect was corrected by empirical coefficient method.The pressure of tablet machine and matrix effect were discussed.The proposed method was applied to determine the major and minor chemical components in arium titanate,and the results were in good agreement with those obtained by chemical analytical methods.The relative standard deviation(n=7) was less than 6.73%.
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