软件缺陷模式的研究  

Study on Software Defect Patterns

作　　者：曾福萍[1] 靳慧亮[1] 陆民燕[1] 

机构地区：[1]北京航空航天大学工程系统工程系,北京100191

出　　处：《计算机科学》2011年第2期127-130,共4页Computer Science

基　　金：装十一五预研(513190702)资助

摘　　要：软件缺陷是导致软件不可靠的根本原因,提高软件可靠性的关键在于减少软件缺陷,那么如何利用积累的缺陷数据提高软件可靠性?结合软件缺陷和模式的概念提出了软件缺陷模式的定义。通过分析积累的软件缺陷数据对缺陷模式的所属分类进行了划分,在此基础上进一步给出了软件需求分析、设计和编码各阶段的软件缺陷模式。最后阐述了在软件开发过程和测试过程中缺陷模式的应用,为如何利用缺陷数据来提高软件可靠性提供了思路。Software defects are the root causes that lead software unreliable,thus the reduction of software defects is the key way to improve software reliability.How to improve the software reliability using the defect data accumulated？ In this paper,the definition of software defect pattern was addressed on the basis of the concept of software defect and pattern.Through analyzing the defect data accumulated,the classification of defect patterns was proposed.The defect patterns in software requirement analysis,design and coding phase were advanced.How to apply the defect patterns is elabo-rated in the process of software development and testing,which provides idea on how to improve software reliability utilizing defect data.

关 键 词：软件缺陷 模式 缺陷模式 缺陷模式库 

分 类 号：TP311[自动化与计算机技术—计算机软件与理论]