神光-Ⅲ原型装置全光路系统波前测量方法  

Entire Beam Wavefront Measurement in Prototype of SG-Ⅲ Facility

作　　者：代万俊[1] 张崑[1] 张鑫[1] 蒋学君[1] 邓武[1] 周维[1] 赵军普[1] 胡东霞[1] 

机构地区：[1]中国工程物理研究院激光聚变中心,四川绵阳621900

出　　处：《中国激光》2011年第2期45-47,共3页Chinese Journal of Lasers

基　　金：中国工程物理研究院科学技术发展基金(2009A0401023)资助课题

摘　　要：为进一步提高神光-Ⅲ原型装置8束三倍频激光焦斑的能量集中度,需要对神光-Ⅲ原型装置的全光路系统波前进行校正。其中的关键技术之一就是要准确获得全光路系统的波前畸变。神光-Ⅲ原型装置的8束激光主放诊断包内均配置了一套哈特曼波前传感器,可以较为方便地获得主放大系统输出波前,但却无法直接获得靶场系统波前。解决方法主要有逆向标定和靶点直接测量两种,通过比较两种方法的技术复杂性、测量准确性等指标,结合对校正前后远场焦斑的测量,最终确定采用靶点直接测量的方法能简单、有效地获得全光路系统波前畸变。In order to improve focal spot concentration of 3ω laser,entire beam wavefront should be corrected.One of key technologies is to get entire beam wavefront aberration exactly.With Hartman wavefront sensor located at parameters diagnosis unit of main amplifier,wavefront of output main amplifier can be obtained.However,wavefront of target system can′t be measured directly.There are two methods to solve this problem including reverse calibration and direct measurement at target point.By comparing complexity and accuracy of the two methods,and combining far field measurement with and without correction,direct measurement at target point is a simple and correct method to get entire beam wavefront.

关 键 词：激光光学 高功率固体激光 标定 哈特曼波前传感器 波前 焦斑 

分 类 号：TN247[电子电信—物理电子学] TN248.1