便携式能量色散X射线荧光仪测定矿渣中铟  

Determination of indium in slag using portable energy dispersive X-ray fluorescence spectrometer

作　　者：郭龙滨[1] 赖万昌[1] 张永涛[1] 何大志[1] 

机构地区：[1]成都理工大学,四川成都610059

出　　处：《冶金分析》2011年第1期19-22,共4页Metallurgical Analysis

基　　金：国家"863"计划(2006AA09Z219)

摘　　要：采用电致冷Si-PIN型半导体探测器和241 Am源作为激发源,以便携式能量色散X射线荧光快速分析仪为手段进行矿渣样品中铟的测定。讨论了样品中主要基体元素Fe、Cu、Pb、Zn等的影响,建立特散比法和一元回归相结合的数学模型对基体效应进行校正。仪器对自制样品重复测量20次,从测量结果分析来看,标准偏差为24.5μg/g,相对标准偏差为6.4%,仪器处于正常工作状态。通过部分自制样品的测量结果与化学分析的结果对比分析,相对误差的最小值为0.35%,仪器测量结果为0.158%;相对误差最大值为26.06%,仪器测量结果为0.023%。The indium in slag was determined by a portable energy dispersive X-ray fluorescence spectrometer using electric refrigerating Si-PIN semiconductor detector and ^241Am as excitation source.The effect of main matrix elements in sample including Fe,Cu,Pb and Zn was discussed.A mathematical model was established to correct the matrix effect by combining special bulk ratio method and simple regression.The self-made sample was repeatedly determined using portable energy dispersive X-ray fluorescence spectrometer for 20 times.The measurement results showed that the standard deviation was 24.5 μg/g and the relative standard deviation（RSD） was 6.4%,so the instrument was under normal working conditions.The determination results of some self-made samples were compared with those obtained by chemical analysis method.The minimum relative error was 0.35 %,and the measurement result of instrument was 0.158 %.The maximum relative error was 26.06 %,and the measurement result of instrument was 0.023 %.

关 键 词：能量色散 X射线荧光分析 基体效应 快速分析 铟 矿渣 

分 类 号：TH744.16[机械工程—光学工程]