蚜虫胁迫下两种栽培模式大豆生理指标及光谱特征分析  

Physiological and hyperspectral characteristics analysis of soybean damage by aphids in two cultivating modes

作　　者：王囡囡[1] 于忠和[1] 贾会彬[1] 朱宝国[1] 孟庆英[1] 宋英博[1] 陈庆山[2] 

机构地区：[1]黑龙江省农业科学院佳木斯分院,黑龙江佳木斯154007 [2]东北农业大学农学院,黑龙江哈尔滨150030

出　　处：《中国油料作物学报》2011年第1期48-51,共4页Chinese Journal of Oil Crop Sciences

基　　金：国家科技部成果转化基金(2007GB2B200100)

摘　　要：在垄三栽培(70cm垄三行栽培,每公顷保苗30万株)和窄行密植栽培(45cm窄行密植栽培,每公顷保苗45万株)中,利用植物光谱仪测定受害叶片的光谱反射率变化。结果表明,大豆蚜虫危害程度可以在大豆叶片的光谱中得到响应,且近红外区比可见光区更明显。大豆植株受蚜虫危害后,其株高、SPAD(单株叶绿素相对含量)、叶面积和地上部干重均有所下降。不同时期两种栽培模式下受大豆蚜虫危害的植株与正常植株相比,其株高和叶面积差异都达到了显著水平。SPAD值表现略有不同,垄三栽培模式下,受虫害植株与正常植株间差异显著;密植栽培模式下,正常植株的SPAD值极显著高于受虫害植株。地上部干物重在垄三栽培模式下,正常植株与虫害植株不存在显著差异;密植模式下,虫害植株干物重显著低于正常植株。In three lines of ridge and narrow row cultivation,we tested spectral reflectance changes of leaf damaged by aphids,with plant spectrometer.Harmful levels of aphids in soybean leaves were observed in the spectrum,and near-infrared region was more prominent than visible light.Plant height,SPAD,leaf area and dry matter accumulation of soybean declined after damaged by aphids.Comparing normal and aphid damaged plants of different growth periods their plant height and leaf area showed significant differences.SPAD showed little difference.There was significant difference between normal and aphid damaged plants in three lines of ridge cultivation;but the SPAD showed highly significant difference in narrow row cultivation.Dry matter accumulation in above-ground soybean showed no difference between normal and aphid damaged plants in narrow row cultivation.There was significant difference in narrow row cultivation.

关 键 词：蚜虫 光谱反射率 叶绿素 栽培模式 

分 类 号：S565.101[农业科学—作物学]