化学还原法合成均匀银纳米线的条件研究  

Conditions for Synthesis of Uniform Ag Nanowires via Chemical Reduction Process

作　　者：郑彦[1] 张哲娟[2] 潘丽坤[1] 郭平生[1] 孙卓[1] 

机构地区：[1]华东师范大学物理系纳光电集成与先进装备教育部工程研究中心,上海200062 [2]华东师范大学化学系纳光电集成与先进装备教育部工程研究中心,上海200062

出　　处：《功能材料与器件学报》2011年第1期7-12,共6页Journal of Functional Materials and Devices

基　　金：上海市科委纳米专项(0952nm02200);上海市科技攻关项目(08DZ1140102和09DZ1141900)

摘　　要：采用化学还原法,以乙二醇为还原剂,聚乙烯砒咯烷酮(PVP K30)为表面活性剂,通过还原硝酸银(AgNO3)溶液直接制备了高浓度的Ag纳米线溶液,并研究了PVP与AgNO3溶液摩尔浓度比和AgNO3溶液浓度对Ag纳米线生长的影响。用扫描电子显微镜(SEM)和透射电子显微镜(TEM)对纳米Ag晶体的生长形貌进行了比较,利用X射线衍射(XRD)分析了Ag纳米线的晶体结构。研究结果表明,在160℃下,当AgNO3溶液浓度为0.6M,PVP/AgNO3的浓度比为6时,可制备规则的面心立方晶系纯相的Ag纳米线,直径为60-100nm,长度可达10μm,且具有产量高和重复性强的特点。Silver nanowires（AgNWs） solution were synthesized from silver nitrate（AgNO3） by chemical reduction method with poly（vinyl pyrrolidone,PVP K30） as the surfactant-and ethylene glycol as reducing agent.The influence of the molar ratio between PVP and AgNO3 and the concentration of AgNO3 solution on the morphology of silver nanowires were studied.The morphologies of silve products were investigated using scanning electron microscopy（SEM） and transmission electron microscopy（TEM）.The structure of AgNWs were characterized using X-ray powder diffraction（XRD）.The results show that the high yield AgNWs have uniform wire-like shape and linear face-centered cubic（FCC） crystal structure under the temperature of 160℃,the concentration of AgNO3 solution of 0.6M and the PVP/AgNO 3 molar ratio at 6.It has demonstrated chemical reduction method is excellent for generating AgNWs with diameter in the range of 60-100nm,and length of up to ～10μm.

关 键 词：银纳米线 化学还原法 制备 

分 类 号：TU51[建筑科学—建筑技术科学]