电流密度对微弧氧化热损耗和膜层致密性的影响  

Factors Influencing the Heat Wastage Efficiency and Density of Micro-arc Oxidation

作　　者：樊向[1] 姚晓菊[2] 

机构地区：[1]兰州理工大学继续教育学院,兰州730050 [2]兰州理工大学理学院,兰州730050

出　　处：《腐蚀与防护》2011年第3期197-199,共3页Corrosion & Protection

摘　　要：在硅酸盐电解液体系中对AZ91D镁合金进行微弧氧化试验，考察了不同电流密度（3、6、9、12、15A／dm^2）对溶液温度变化量、热损耗和膜层致密性的影响。结果表明，随电流密度的增加，体系温度变化量从18℃持续增加到33℃；体系热损耗先减小后增大；膜层的致密度先增太后减小。The coatings of magnesium alloy were prepared by microarc oxidation at different current densities（3, 6, 9, 12 and 15 A/dm^2） in silicate solution. The influences of current density on the temperature variation of solution, heat wastage efficiency and compactness of film were investigated. The results show that with increasing the current density, the temperature variation increased from 18 ℃ to 33 ℃, the heat wastage efficiency decreased at first stage and then increased, the compactness of film increased first and then decreased.

关 键 词：微弧氧化 镁合金 温度变化量 热损耗率 致密度 

分 类 号：TG174[金属学及工艺—金属表面处理]