铜纳米线阵列的表面增强拉曼光谱和AFM研究  

Surface enhanced Raman Spectroscopic and AFM Studies on the Arrays of Copper Nanowires

作　　者：姚建林[1,2] 汤儆[1,2] 谢泳[1,2] 毛秉伟 任斌[1,2] 田中群[1,2] 潘谷平[3] 孙冬梅[3] 薛宽宏[3] 

机构地区：[1]固体表面物理化学国家重点实验室 [2]厦门大学物理化学研究所 [3]南京师范大学化学系

出　　处：《光散射学报》1999年第3期235-238,共4页The Journal of Light Scattering

基　　金：国家自然科学基金

摘　　要：通过以有序的多孔氧化铝为模板，利用交流电在孔中沉积金属铜，并以此作为ＳＥＲＳ活性基底。原子力显微镜（ＡＦＭ）研究了氧化铝溶解过程中铜纳米线形貌，共焦显微拉曼则研究表面吸附ＳＣＮ的ＳＥＲＳ光谱的变化。结果表明：铜纳米线表面ＳＥＲＳ强度和纳米金属在表面直立的高度有关；而其频率和直立的高度无关。ＳＣＮ吸附在纳米线上比普通电化学粗糙的电极表面ＳＥＲＳ强度高，说明纳米线（点）有望成为一种活性高，稳定性好的ＳＥＲＳ基底。The research on nanowires has been developed aggressively in the past few years because of their novel properties and potential of wide applications. The present work has focused on the application of ordered arrays of metal nanowires as surface enhanced Raman scattering (SERS) active substrates. The results reveal that the SERS intensities depend critically on the wires length emerged on the surface that was controlled by the etching time. The SERS signals observed are considerably stronger than that from the conventional roughened electrode surfaces. The Cu nanowires may be used as high active SERS substrates.

关 键 词：铜纳米线阵列 表面增强 拉曼光谱 AFM 

分 类 号：O614.121[理学—无机化学] O657.37[理学—化学]