基于调制度测量的三维轮廓术  

3-D Profilometry Based on Modulation Measurement

作　　者：苏礼坤[1] 苏显渝[1] 李万松[1] 向立群[1] 

机构地区：[1]四川联合大学光电科学技术系,成都610064

出　　处：《光学学报》1999年第9期1257-1262,共6页Acta Optica Sinica

基　　金：国家自然科学基金

摘　　要：介绍了基于调制度测量的三维轮廓术的测量方法的原理和过程， 并给出了实物测量。结果证明它在原理上是正确的、可行的。此方法对三维轮廓术、三维传感及机器视觉的应用具有重要意义。D profilometry based on modulation measurement (MMP) depends on the modulation distribution of the sinusoidal fringes projected on objects. The projecting direction is the same as the detecting direction, it can measure the objects with shadow, discontinuous height steps and spatial isolation on them. The detailed introduction on the principle and processing method of MMP and the measuring results for an object are presented. The results proved that MMP was correct in principle and effective in actual measurement. This method will be useful for 3 D profilometry、 3 D sensing and machine vision etc.

关 键 词：光学三维轮廓术 调制度测量 相移 

分 类 号：O438[机械工程—光学工程] TG806[理学—光学]