显微织构取向分布函数的电子背散射衍射测定  

Electron backscatter diffraction determination of orientation distribution function of microtexture

作　　者：刘静[1] 雷建林[1] 王仁卉[1] 

机构地区：[1]武汉大学物理系

出　　处：《电子显微学报》1999年第4期462-467,共6页Journal of Chinese Electron Microscopy Society

摘　　要：用电子背散射衍射（ Ｅ Ｂ Ｓ Ｄ）技术可以分别对试样中不同类型的晶粒，测定其显微织构。当 Ｅ Ｂ Ｓ Ｄ 附件只能给出显微织构的极图、反极图和每一晶粒的欧拉角时，本文介绍了如何编写计算机程序由欧拉角数据获取取向分布函数（ Ｏ Ｄ Ｆ）。当试样在扫描电镜中的放置方位不同于仪器所规定的标准放置方位时，本文介绍了如何由仪器给出的欧拉角计算出对应于非标准放置的试样的欧拉角，并进而获取 Ｏ Ｄ Ｆ的方法。By using electron backscatter diffraction (EBSD) it is possible to determine microtextures of different types of grains separately.However,some EBSD attachment can only provide pole figures,invese pole figures and Euler angles of each measured grain.In this case we have developed a program to get orientation distribution functions (ODFs) from the Euler angles.Sometimes the setting orientation of the sample is different from the standard one given by the EBSD attachment.In this case we have provided a method to calculate the Euler angles of the grains in the sample with a nonstandard setting from those Euler angles given by the EBSD attchment.

关 键 词：电子背散射衍射 显微织构 取向分布函数 晶粒 

分 类 号：O766.4[理学—晶体学]