Epitaxial growth of ultrathin ZrO_2(111) films on Pt(111)  

作　　者：GAO Yan ZHANG Liang PAN YongHe WANG GuoDong XU Yang ZHANG WenHua ZHU JunFa 

机构地区：[1]National Synchrotron Radiation Laboratory, University of Science and Technology of China, Hefei 230029, China

出　　处：《Chinese Science Bulletin》2011年第6期502-507,共6页

基　　金：supported by the Specialized Research Fund for the Doctoral Program of Higher Education (SRFDP, 200803580012);the National Natural Science Foundation of China (20873128);the Program for New Century Excellent Talents in University (NCET);the National Basic Research Program of China (2010CB923302);the Hundred Talents Program of the Chinese Academy of Sciences

摘　　要：Ordered epitaxial ZrO2 films were grown on Pt(111) and characterized by low energy electron diffraction (LEED), synchrotron radiation photoemission spectroscopy (SRPES) and X-ray photoelectron spectroscopy (XPS). The films were prepared by vapor deposition of zirconium in an O2 atmosphere followed by annealing under ultra high vacuum. At low coverages, the films grew as discontinuous two-dimentional islands with ordered structures. The size and structure of these islands were dependent on the coverage of ZrO2 films. At coverage <0.5 monolayer (ML), ( 19^(1/2) × 19^(1/2)) R23.4° and (5×5) structures coexisted on the surface. As the coverage increased, the (19^(1/2) × 19^(1/2) ) R23.4° structure developed with increasing degree of long-range order, while the (5×5) structure gradually faded. When the coverage reached >6 ML, a continuous ZrO2(111) film was formed with a (1×1) surface LEED pattern coexisting with a (2×2) pattern. These ordered thin ZrO2 films provide good model surfaces of bulk ZrO2 and can be used for further fundamental studies of the surface chemistry of ZrO2 using modern surface science techniques.Ordered epitaxial ZrO2 films were grown on Pt（111） and characterized by low energy electron diffraction （LEED）, synchrotron radiation photoemission spectroscopy （SRPES） and X-ray photoelectron spectroscopy （XPS）. The films were prepared by vapor deposition of zirconium in an O2 atmosphere followed by annealing under ultra high vacuum. At low coverages, the films grew as discontinuous two-dimentional islands with ordered structures. The size and structure of these islands were dependent on the cov of ZrO2 films. At coverage 〈0.5 monolayer （ML）, and （5x5） structures coexisted on the surface. As erage the coverage increased, the structure developed with increasing degree of long-range order, while the （5×5） structure gradually faded. When the coverage reached 〉6 ML, a continuous ZrO2（111） film was formed with a （1×1） surface LEED pattern coexisting with a （2×2） pattern. These ordered thin ZrO2 films provide good model surfaces of bulk ZrO2 and can be used for further fundamental studies of the surface chemistry of ZrO2 using modern surface science techniques.

关 键 词：二氧化锆薄膜 薄膜外延生长 同步辐射光电子能谱 超薄 有序结构 表面图案 低能电子衍射 化学基础研究 

分 类 号：O484.1[理学—固体物理] TG174.41[理学—物理]