基于Kerr效应的绝缘子表面电场在线测量系统  

System for On-line Measuring Electric Field on Insulator Surface Based on Kerr Effect

作　　者：朱宏林[1] 刘微粒[1] 邹晓兵[1] 王新新[1] 徐硕[1] 

机构地区：[1]清华大学电机工程与应用电子技术系电力系统及发电设备控制和仿真国家重点实验室,北京100084

出　　处：《高电压技术》2011年第3期718-725,共8页High Voltage Engineering

摘　　要：为了有助于快脉冲功率装置中真空绝缘子的正确设计,避免其沿面闪络,研制了1套基于Kerr效应的可以在线测量快脉冲高电压作用下的真空绝缘子表面电场的电光测量系统。该测量系统由基于Marx发生器和脉冲形成线的快脉冲高电压源(100ns,200～350kV)、基于Nd:YAG倍频脉冲激光器的探测光源(532nm,8ns)、抗强电磁干扰的同步控制系统、被测中空薄壁绝缘子及Kerr效应单元、相位差检测系统(Mach-Zehnder干涉仪)等部分构成。在分析了快脉冲高电压作用下在线测量的必要性后介绍了该测量系统各部分的组成、工作原理、运行参数及初步实验结果。In order to help a correct design of a vacuum insulator used in a fast pulsed power device,so as to avoid the insulator flashover,an electro-optical measurement system based on Kerr effect was constructed.The system is capable of on-line measuring the electric field on the surface of a vacuum insulator that is being stressed with a fast and high voltage.The system is composed of 5 subsystems,including a fast high voltage source（100 ns,200~350 kV） based on a Marx generator and a pulse forming line,a detecting light source（532 nm,8 ns） based on a Nd：YAG laser,a synchronization system with a high noise-immunity,a Kerr effect cell in which a tested insulator is immersed in nitrobenzene liquid,and a phase-difference analyzer（Mach-Zehnder interferometer）.The operation principles and the experimental results of the system and the subsystems were described.

关 键 词：真空绝缘子 表面电场 表面电荷 克尔效应 电光测量 马赫-贞德干涉仪 

分 类 号：TM216[一般工业技术—材料科学与工程] TM930.124[电气工程—电工理论与新技术]