SPARC体系结构处理器测试方法研究与实现  

Study and Implementation of Test Method for SPARC Processor

作　　者：张晓静[1] 华更新[1] 刘鸿瑾[1] 

机构地区：[1]北京控制工程研究所,北京100190

出　　处：《计算机测量与控制》2011年第3期512-515,共4页Computer Measurement &Control

摘　　要：处理器离线测试广泛采用随机测试技术,但是随机测试技术生成大量测试代码,并且测试覆盖率不高;主要针对随机测试的不足,借鉴基于软件内建自测试方法建立处理器模块级于系统级功能模型,后分析功能模型可能发生错误,针对错误模型开发测试代码来提高错误覆盖率;经测试,模块级测试覆盖到所有功能点,达到功能模块100%测试,系统级的测试覆盖到SPARC V8的所有指令异常、正常测试用例;测试结果表明,所采取的测试方案对提高错误覆盖率是行之有效的。Random test technology is widely used in processor off--line test, but Random test generate large amount of test code, and low fault coverage. The paper aim at shortage of random test, using software--based self--testing construct module level and system--level fault models of functional level, then analyse fault of functional models, and develop test code to improve fault coverage. By test, module testing coverage 100% module function, system-level testing coverage all the SPARC V8 instructions set and its exception, the normal test cases. Experimental results demonstrate that the test Method is fairly efficient for improving fault coverage.

关 键 词：微处理器测试 指令集测试 伪随机测试. 

分 类 号：TP368[自动化与计算机技术—计算机系统结构]