基于AVR单片机与FPGA的低频数字式相位测量仪  

Low-frequency digital phase measuring instrument based on AVR MCU and FPGA

作　　者：井新宇[1] 

机构地区：[1]江阴职业技术学院,江苏江阴214400

出　　处：《电子设计工程》2011年第5期26-29,共4页Electronic Design Engineering

摘　　要：提出了以AVR ATmega128单片机和Altera公司的Cyclone系列EP1C3T100为核心的系统设计方案。分析了数字式低频相位测量仪的测量原理和测量误差及其消除的方法。利用单片机强劲的运算、控制功能和FPGA运算速度快、资源丰富的特点。主要介绍了系统的软硬件设计。实践表明,此方案设计的相位仪对低频正弦波信号实现精确测频和测相位差,具有处理速度快、稳定可靠、精度高等优点。This paper proposes a system design proposal which used ATmega128 of AVR MCU and Cyclone＇s EP1C3T100, produced by Altera company as the core.This paper analyzed the measuring principle of the low frequency digital phase measuring instrument, the measurement error and the method how to eliminate the error. The powerful operation and control function of MCU and FPGA＇s characteristics of high operating speed and rich resource were utilized. The hardware and software design of the system was mainly introduced. The practice shows that it can precisely measure the frequency and phase of low-frequency sine signal, and the phase measuring instrument has many advantages such as fast processing speed,stability,reliability and high precision.

关 键 词：数字相位仪 单片机 FPGA 误差 频率 相位差 

分 类 号：TM38[电气工程—电机]