电路容差分析在设计中的应用  

Application of Circuit Tolerance Analysis to the Design

作　　者：石永山[1] 王飞[2] 刘铭[1] 

机构地区：[1]海军驻锦州地区军事代表室,辽宁锦州121000 [2]东北电子技术研究所,辽宁锦州121000

出　　处：《光电技术应用》2010年第6期49-52,共4页Electro-Optic Technology Application

摘　　要：阐述了电路容差分析的基本概念,探讨了导致元器件参数漂移的因素及参数漂移对设备质量影响的方式,强调了电路容差分析在设备研制过程中的运用对提高设备设计质量的重要性.简要分析了电路容差分析流程,重点探讨了3种电路容差分析方法的优缺点、使用环境要求及应用方法.最后展望了电路容差分析的应用前景.The basic conception of the circuit tolerance analysis was described and the factors of the parameter drift of devices and the methods that the parameter drift influences the quality of equipments were discussed.The essentiality that the application of circuit tolerance analysis to the process of equipments developing increases the quality of equipments design was stressed.The flows of the circuit tolerance analysis were introduced briefly,the advantages and disadvantages for three methods of the circuit tolerance analysis,the requirements of the application environments and application methods were analyzed mainly.At last,the application prospects of the circuit tolerance analysis were prospected.

关 键 词：设备质量 容差分析 参数漂移 

分 类 号：TN709[电子电信—电路与系统]