JEM 2100透射电镜照相系统故障分析  

Problems Analysis on Camera Systems of JEM 2100 Transmission Electron Microscope

作　　者：赵梅[1] 王国红[1] 常雷[1] 金头男[1] 

机构地区：[1]北京工业大学材料科学与工程学院,北京100022

出　　处：《理化检验（物理分册）》2010年第11期710-711,722,共3页Physical Testing and Chemical Analysis(Part A:Physical Testing)

摘　　要：对JEM 2100透射电镜照相系统正常拍片程序进行了介绍,分析了卡片、传送机构不工作和传送中途失败等故障及其排除办法,可作为同类型电镜的照相系统故障维修时的参考。The normal photographic process of JEM 2100 transmission electron microscope was introduced. The problems such as photoplate locking,inoperative transport mechanism,failure in transport process and so on, and their solutions were analyzed,that provided the reference for breakdown maintenancce of camera systems of the same type electron microscopes.

关 键 词：透射电镜 照相系统 故障分析 

分 类 号：TG115.215.3[金属学及工艺—物理冶金]