速调管双耦合孔输出腔外观品质因数的计算  

Calculation of External Quality Factor of Klystron Output Cavity with Double Coupling Apertures

作　　者：韩慧鹏[1,2] 王勇[1] 张瑞[1,2] 阮望[1] 

机构地区：[1]中国科学院电子学研究所中国科学院高功率微波源与技术重点实验室,北京100190 [2]中国科学院研究生院,北京100049

出　　处：《真空科学与技术学报》2011年第2期159-162,共4页Chinese Journal of Vacuum Science and Technology

基　　金：2008年中国科学院研究生科技创新基金资助项目

摘　　要：提出了一种采用散射参数S21曲线来计算速调管双耦合孔输出腔外观品质因数的方法。首先借助仿真软件CST-MWS模拟计算了Toshiba研制的速调管(E3736)的具有双耦合孔输出腔的外观品质因数,发现计算结果与文献数据一致;然后对中科院电子所研制的S波段、具有双耦合孔输出腔的外观品质因数进行了计算,结果与冷测数据吻合,从而证明了该方法的有效性。A novel technique has been successfully developed,to calculate the external quality factor of the klystron output cavity with double coupling apertures,by means of the curve of the scattering parameter S21.Firstly,this kind of output cavity for MBK-E3736（Toshiba） was modeled and simulated with the software CST-MWS.And then the external quality factor of the output cavity was calculated by the technique,and the results were consistent with the literature.Furthermore,the new technique was used in evaluating the external quality factor of this type of output cavity for the S-band klystron prototype fabricated in IECAS.The calculated results agreed well with those obtained in the cold test.

关 键 词：速调管 双耦合孔输出腔 外观品质因数 散射参数 

分 类 号：TN122[电子电信—物理电子学]