各种粒度表征技术的相关性研究  被引量:10

Research of the technology on different characterization of particle size

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作  者:谭立新[1] 蔡一湘[1] 余志明[2] 梁泰然[1] 

机构地区:[1]广东省工业技术研究院(广州有色金属研究院),广东广州510650 [2]中南大学材料科学与工程系,湖南长沙410083

出  处:《材料研究与应用》2011年第1期57-61,共5页Materials Research and Application

摘  要:对几种普遍使用的粒度测试技术进行了比较,认为激光衍射法测量结果的重复性最好,测量精度高.对粒径范围较窄的球形粉体(单分散颗粒),分别采用激光衍射法、电阻法、沉降法和显微镜法测量的中位径(D50)值具有可比性;对粒径范围较宽的球形粉体,只有激光衍射法、电阻法和显微镜法测量的中位径D50值具有可比性,沉降法的测量结果相对误差较大,不具有可比性;对不规则形状的粉体颗粒,采用这些测试技术测得的中位径值一般没有可比性.用比表面积法测量的比表面积粒径偏小,测量结果与上述四种粒度测量方法不可比.显微镜法不适合对粒径范围较大、形状不规则的颗粒进行粒度测试.By comparing several measurement methods of the particle size(PS), such as laser diffraction method, electric-resistivity method, sedimentation method, microscope method and specific surface area method, it is found that the results measured by laser diffraction method exhibit the best repeatability and high precision. For the spherical particles with narrow PS range, the values of median-particle-size (MPS), Ds0, measured by the above four methods are comparable. For the spherical particles with wide PS range, the values of MPS measured by partial methods are comparable. For the particles with irregular shape, the MPS measured by different methods are not comparable. The PS measured by specific surface area method is relatively small, which is not comparable to those obtained from the above four methods. The microscope method is not suitable for testing the size of the irregular particles with wide PS range.

关 键 词:粒度测试 激光衍射法 沉降法 电阻法 显微镜法 比表面积法 

分 类 号:TB302.1[一般工业技术—材料科学与工程]

 

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