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作 者:王晓燕[1] 沈牧[1] 任永学[1] 程义涛[1]
机构地区:[1]中国电子科技集团公司第十三研究所,石家庄050051
出 处:《半导体技术》2011年第4期265-268,共4页Semiconductor Technology
摘 要:针对大功率半导体激光器阵列难以进行光场分布测试评价的问题,设计了大功率激光器光场分布测试系统。从测试系统探测器的抗损伤阈值方面,分析了对激光衰减的比例要求,提出了几种衰减的方法,设计了低透射系数高抗激光损伤的衰减方案,并进行逐一的测试比较,得到了理想的衰减效果。结合测试系统要求,完成了大功率半导体激光器光场分布的测试与评价。The test of optical field distribution for high-power semiconductor laser array is difficult. A test system for high-power laser optical field distribution was designed. From the anti-damage threshold of the test system detector, the laser attenuation ratio requirement was analysised ; the several attenuation method was proposed; a program which has the low transmission coefficient and the high resistance to laser damage was designed; And the test was compared one by one to get the ideal attenuation at last. For the test system requirements, the test and evaluation of high-power semiconductor laser optical field distribution was completed.
关 键 词:半导体激光器阵列 激光损伤阈值 衰减 光场 发散角
分 类 号:TN248.4[电子电信—物理电子学]
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