基于CPLD的线束测试台的研究  

Research on Harness Test Table Based on CPLD

作　　者：谭志飞[1] 毛美姣[1] 

机构地区：[1]湘潭大学机械工程学院,湖南湘潭411105

出　　处：《机械工程师》2011年第4期30-31,共2页Mechanical Engineer

基　　金：湖南省教育厅一般资助项目(08C868)

摘　　要：基于CPLD扩展最小单片机系统的I/O口,对384点线束的绝缘耐压性能进行测试,包括测试各导线之间的绝缘电阻和漏电流以及各导线与外壳之间的绝缘电阻和漏电流。实际应用表明:该方法的硬件电路简单,系统运行可靠,测试过程简单快捷,且可扩展性好。This article focuses on the topics of extending the mini mcu system I/O port and testing the insulated withstanding voltage performance of three hundreds and eighty-four points harness,which includes the test of inter-conductor insulated resistance and leakage current,and the test of insulated resistance and leakage current between every conductor and shell.This article shows that the method makes the curcuit simple,the system running reliably,the test process rapid,and the extensibility well.

关 键 词：CPLD 线束 绝缘耐压性能 测试 

分 类 号：TP23[自动化与计算机技术—检测技术与自动化装置]