Scan chain design for shift power reduction in scan-based testing  

作　　者：LI Jia HU Yu LI XiaoWei 

机构地区：[1]The School of Software, Tsinghua University, Beijing 100084, China [2]The Institute of Computing Technology, Chinese Academy of Sciences, Beijing 100190, China

出　　处：《Science China(Information Sciences)》2011年第4期767-777,共11页中国科学（信息科学）（英文版）

基　　金：supported by the National Natural Science Foundation of China (Grant Nos. 60633060, 60803031, 61006017);the National Basic Research Program of China (Grant No. 2005CB321604);the National High-Tech Research & Development Program of China (Grant Nos. 2007AA01Z107, 2007AA01Z113, 2007AA01Z109, 2009AA01Z129);the National Science Foundation of China (Grants Nos. 60425203, 60910003);the Key Laboratory of Computer System and Architecture, ICT, CAS (Grant No. ICT-ARCH200902);China Postdoctoral Science Foundation (Grant No. 20100470014)

摘　　要：Test power of VLSI systems has become a challenging issue nowadays. The scan shift power dominates the average test power and restricts clock frequency of the shift phase, leading to excessive thermal accumulation and long test time. This paper proposes a scan chain design technique to solve the above problems. Based on weighted transition metric （WTM）, the proposed extended WTM （EWTM） that is utilized to guide the scan chain design algorithm can estimate the scan shift power in both the shift-in and shift-out phases. Moreover, the wire length overhead of the proposed scan chain design can also be reduced by the proposed distance of EWTM （DEWTM） metric. Experimental results confirm that the proposed approach can significantly reduce scan shift power with low wire length overhead.Test power of VLSI systems has become a challenging issue nowadays. The scan shift power dominates the average test power and restricts clock frequency of the shift phase, leading to excessive thermal accumulation and long test time. This paper proposes a scan chain design technique to solve the above problems. Based on weighted transition metric （WTM）, the proposed extended WTM （EWTM） that is utilized to guide the scan chain design algorithm can estimate the scan shift power in both the shift-in and shift-out phases. Moreover, the wire length overhead of the proposed scan chain design can also be reduced by the proposed distance of EWTM （DEWTM） metric. Experimental results confirm that the proposed approach can significantly reduce scan shift power with low wire length overhead.

关 键 词：low power DfT scan-based testing test power reduction scan chain design 

分 类 号：TN407[电子电信—微电子学与固体电子学] TP273.4[自动化与计算机技术—检测技术与自动化装置]