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机构地区:[1]College of Physics Science and Technology,Hebei University
出 处:《Communications in Theoretical Physics》2011年第4期688-692,共5页理论物理通讯(英文版)
基 金:Supported by the National Natural Science Foundation of China under Grant No.60940020;the Natural Foundation of Hebei Province under Grant No.E2008000619
摘 要:The amorphous silicon nanoparticles (Si NPs) embedded in silicon nitride (SiNx) films prepared by helicon wave plasma-enhanced chemical vapor deposition (HWP-CVD) technique are studied. From Raman scattering investigation, we determine that the deposited film has the structure of silicon nanocrystals embedded in silicon nitride (nc-Si/SiNx) thin film at a certain hydrogen dilution amount. The analysis of optical absorption spectra implies that the Si NPs is affected by quantum size effects and has the nature of an indirect-band-gap semiconductor. Further, considering the effects of the mean Si NP size and their dispersion on oscillator strength, and quantum-confinement, we obtain an analytical expression for the spectral absorbance of ensemble samples. Gaussian as well as lognormal size-distributions of the Si NPs are considered for optical absorption coefficient calculations. The influence of the particle size-distribution on the optical absorption spectra was systematically studied. We present the fitting of the optical absorption experimental data with our model and discuss the results.
关 键 词:optical absorption silicon nanoparticles quantum size effects oscillator strength silicon nitride film
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