基于确定性测试图形的BIST构建方法  

Method Based on Deterministic Test Pattern for Designing BIST

作　　者：葛鹏岳[1] 黄考利[1] 刘晓芹[1] 连光耀[1] 

机构地区：[1]军械工程学院军械技术研究所,河北石家庄050003

出　　处：《计算机测量与控制》2011年第4期803-805,共3页Computer Measurement &Control

摘　　要：为降低内建自测试(Build-in Self Test,BIST)的测试功耗,提出了一种基于确定性测试图形的内建自测试构建方法:首先采用D算法生成测试所需的测试图形,然后使用粒子群算法对其进行优化,使内建自测试的功耗大幅度降低;文中最后以ISCAS’85Benchmark中的部分电路作为实验对象,并给出了测试图形优化前后的功耗数;实验结果证明该方法能够有效降低内建自测试的测试功耗,并且具有方法简单、无需额外硬件开销的特点。In order to reduce the power dissipation of biuld-in self test（BIST）,this paper proposed a method based on deterministic test pattern for designing BIST.Firstly,we used D algorithm to generate test pattern for testing;then we used particle swarm optimization to optimized the test pattern.In the end of this paper,we took some circuits of ISCAS＇85 Benchmark as our circuit under test and present the result.The experiment proves that this method for designing BIST can not only reduce power dissipation of BIST but also needs no more hardware and it is very easy.

关 键 词：内建自测试 确定性测试图形 粒子群优化算法 

分 类 号：TP273[自动化与计算机技术—检测技术与自动化装置]